ON CONFIGURABLE OVERSAMPLED A/D CONVERTERS
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Publication Details
Output type: Journal article
Author list: NYS OJAP, DIJKSTRA E
Publisher: Institute of Electrical and Electronics Engineers
Publication year: 1993
Journal: IEEE Journal of Solid-State Circuits (0018-9200)
Volume number: 28
Issue number: 7
Start page: 736
End page: 742
Number of pages: 7
ISSN: 0018-9200
eISSN: 1558-173X
Languages: English-Great Britain (EN-GB)
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Open access status: closed
Abstract
This paper presents a configurable oversampled A/D converter that can be either configured as a sigma-delta converter or an incremental converter. The latter refers to oversampled instrumentation converters that cancel offset and 1/f noise. The converter architecture is based on a new concept called mixed analog-digital integrator (MADI). As will be demonstrated in this paper, this concept leads to a very simple and modular architecture. In addition to the configurability as a sigma-delta or incremental converter, the implemented converter allows selection of the converter order and the decimation factor in order to find the best trade-off between resolution, conversion time or bandwidth, and power consumption. As the converter architecture is completely modular, it can rapidly be tailored for a specific application with minimized silicon area. The circuit achieves a resolution of 16 b on a range of +/-650 mV and compensates the offset and the even-order harmonics to a nonobservable level.
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